Current Issue

Volume 1, Number 3

On Approach to Increase Integration Rate of Elements of an Comparator Circuit
E.L. Pankratov, Nizhny Novgorod State University, Russia

A Single-Ended and Bit-Interleaving 7T SRAM Cell in Sub-Threshold Region With A Small Area Consuption
Mahdi Tavazoei and Farhad Razaghian, Islamic Azad University, Iran

Volume 1, Number 2

On Optimization of Manufacturing of Field-Effect Heterotransistors a Threestage Amplifier Circuit, To Increase their
Density

E.L. Pankratov, Nizhny Novgorod State University, Russia

On Optimization of Manufacturing of a Dynamic Comparator Based on Hetero-Structures to Increase Density of their
Elements. Influence of Miss-Match Induced Stress and Porosity of Materials on Technological Process

E.L. Pankratov, Nizhny Novgorod State University, Russia

Volume 1, Number 1

A Review of Low Power and Area Efficient FSM Based LFSR for Logic BIST
Sabirhussain1 and Alleshwararao2, 1Osmania University, India and 2GITAM University, India

A Theoretical Implementation with Physical Design of V-Diode
Soudip Sinha Roy, Physics Tomorrow Hooghly, India

Structure-Preserving Modelling of Real Circuits Based on Signal Flow Graph
Mohamed Denguir and Sebastian M. Sattler, Friedrich-Alexander-University Erlangen Nuremberg (FAU), Germany

A Stand Alone Low Power Digital Temperature Sensor for IC Monitoring
Hawraa Amhaz1, Louay Abdallah1, Adnan Harb1, Ali Chehadi2, Youssef Abed Al karim2, Ali Shawish2and Ziad Noun2, 1International University of Beirut, Lebanon and 2Lebanese International University, Lebanon

Non-Linear Method for Separation and Analysis of High-Dimensional Test Results of an Electronic System
Mohamed Denguir, Naime Denguir and Sebastian M. Sattler, Friedrich-Alexander-University Erlangen-Nuremberg (FAU), Germany

Early Failures Diagnosis Based on Multidimensional Analysis and Separation of High-Dimensional Test Results of an
Electronic System

Mohamed Denguir, Naime Denguir and Sebastian M. Sattler, Friedrich-Alexander-University Erlangen-Nuremberg (FAU), Germany